Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8395406 | Integrated circuit architecture for testing variable delay circuit | Tooru Iwashita, Atsushi Tangoda | 2013-03-12 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8395406 | Integrated circuit architecture for testing variable delay circuit | Tooru Iwashita, Atsushi Tangoda | 2013-03-12 |