Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7315971 | Systems and methods for improved memory scan testability | William E. Grose, Jeanne Krayer Pitz, Toru Tanaka | 2008-01-01 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7315971 | Systems and methods for improved memory scan testability | William E. Grose, Jeanne Krayer Pitz, Toru Tanaka | 2008-01-01 |