Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12223237 | Generation method, estimation method, generator, and estimator | Hiroko Yoshida, Nobuo Hara, Akihisa Nakahashi | 2025-02-11 |
| 11836914 | Information processing method and information processing device for detecting a trace formed on a surface of a workpiece | Nobuo Hara, Takeshi Yamasaki, Tomoyuki Ishikawa, Seita Takahashi | 2023-12-05 |
| 7894053 | Inspection apparatus | Masanori Fukuda, Yutaka Omori | 2011-02-22 |
| 6714671 | Method of detecting pattern defects | Noriaki Yukawa | 2004-03-30 |