Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12376400 | Imaging device | Hidenobu TSUGAWA, Ryoichi Nakamura, Hiroshi Takahashi | 2025-07-29 |
| 7167582 | Mask inspection method, mask defect inspection system, and method of production of mask | — | 2007-01-23 |