KL

Khai Le

RS Rapiscan Systems: 3 patents #31 of 130Top 25%
SU Supertex: 3 patents #14 of 39Top 40%
RP Rapiscan Security Products: 2 patents #6 of 21Top 30%
LS Lsi: 1 patents #914 of 1,740Top 55%
RH Rapiscan Holdings: 1 patents #8 of 19Top 45%
Overall (All Time): #352,498 of 4,157,543Top 9%
14
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
8751861 System and method for improved rebuild in RAID Naman Nair 2014-06-10
8498376 Method and system for certifying operators of x-ray systems Peter Modica, Phong Nguyen 2013-07-30
7903783 Method and system for certifying operators of x-ray inspection systems Peter Modica, Phong Nguyen 2011-03-08
7505557 Method and system for certifying operators of x-ray inspection systems Peter Modica, Phong Nguyen 2009-03-17
7336767 Back-scattered X-ray radiation attenuation method and apparatus 2008-02-26
7257189 Method and system for certifying operators of x-ray inspection systems Peter Modica, Phong Nguyen 2007-08-14
7139367 Time share digital integration method and apparatus for processing X-ray images 2006-11-21
6940733 Optimal control of wide conversion ratio switching converters David Schie, Alexander Mednik, James Nguyen, Sang Ton Ngo, Wei Gu +1 more 2005-09-06
6917504 Apparatus and method for adaptively controlling power supplied to a hot-pluggable subsystem James Nguyen, Sang Ton Ngo, David Chalmers Schia, Ladislas G. Kerenyi 2005-07-12
6843599 Self-contained, portable inspection system and method Andreas F. Kotowski 2005-01-18
6839403 Generation and distribution of annotation overlays of digital X-ray images for security systems Andreas F. Kotowski, Douglas R. Gillard-Hickman 2005-01-04
6525515 Feedback apparatus and method for adaptively controlling power supplied to a hot-pluggable subsystem Sang Ton Ngo, James Nguyen, David Chalmera Schie, Ladislas G. Kerenyi 2003-02-25
6473487 Method and apparatus for physical characteristics discrimination of objects using a limited view three dimensional reconstruction 2002-10-29
5442672 Three-dimensional reconstruction based on a limited number of X-ray projections Paul Bjorkholm, Keith E. Moler 1995-08-15