Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7853851 | Method and apparatus for detecting degradation in an integrated circuit chip | Daniel J. Beckman | 2010-12-14 |
KC
Kenny C. Cross
Overall (All Time): #3,312,795 of 4,157,543Top 80%
1
Patents All Time