Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5199054 | Method and apparatus for high resolution inspection of electronic items | John A. Adams, Bruce D. Baker, Robert L. Corey, Brian L. Ganz, David C. Reynolds +3 more | 1993-03-30 |
| 4745684 | Solder thickness measurement method and apparatus | Robert A. Harger | 1988-05-24 |