Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5568531 | Surface defect evaluating apparatus | Atsushi Kawabata | 1996-10-22 |
| 5249216 | Total reflection X-ray fluorescence apparatus | Tetsuya Ohsugi, Michihisa Kyoto | 1993-09-28 |
| 5220591 | Total reflection X-ray fluorescence apparatus | Tetsuya Ohsugi, Michihisa Kyoto | 1993-06-15 |