Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9965851 | Method for inspecting pattern and an apparatus for manufacturing a semiconductor device using the same | Kiho Yang, Seunghune Yang | 2018-05-08 |
| 9672611 | Pattern analysis method of a semiconductor device | Kiho Yang, Seunghune Yang, Sibo Cai | 2017-06-06 |