Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12422350 | Multiple-reflection apparatus and multiple-reflection cell | Tomohiro Katsumata, Kazuya Nakagawa | 2025-09-23 |
| 8763447 | Ultraviolet curing resin property measuring apparatus | Toshiyuki Nagoshi, Mitsuo Watanabe, Takashi Inoue, Shigeru Ito | 2014-07-01 |
| 8749780 | Circular dichroism spectrometer having alignment mechanism | Tetsuji Sunami | 2014-06-10 |
| 8531674 | Microscopic total reflection measuring apparatus | Noriaki Soga, Hiroshi Sugiyama, Takayuki Sera | 2013-09-10 |
| 7954069 | Microscopic-measurement apparatus | Masaaki Yumoto, Kenichi Akao, Yoshiko Akao | 2011-05-31 |
| 7903253 | Microscope | — | 2011-03-08 |
| 7869039 | Microscopic-measurement apparatus | Kenichi Akao | 2011-01-11 |
| 7693689 | Noise-component removing method | Tetsuji Sunami, Kenichi Akao, Keisuke Watanabe | 2010-04-06 |
| 7492460 | Attenuated-total-reflection measurement apparatus | Noriaki Soga | 2009-02-17 |
| 7224460 | Mapping-measurement apparatus | Noriaki Soga, Hiroshi Tsukada | 2007-05-29 |
| 7002692 | Infrared circular dichroism measuring apparatus and infrared circular dichroism measuring method | Kenichi Akao | 2006-02-21 |
| 6891162 | Method of acquiring data from multi-element detector in infrared imaging apparatus | Toshiyuki Nagoshi, Seiichi Kashiwabara | 2005-05-10 |
| 6867417 | Method of acquiring data from multi-element detector in infrared imaging apparatus | Toshiyuki Nagoshi, Seiichi Kashiwabara | 2005-03-15 |