Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7944205 | System for measuring a magnetic resonance signal based on a hybrid superconductive-magnetoresistive sensor | Claude Fermon, Jacques Jacquinot, Myriam Pannetier-Lecoeur | 2011-05-17 |
| 6920241 | System and method for bundled location and regional inspection | Paul Dutta-Choudhury, Bradford Safford | 2005-07-19 |
| 6714679 | Boundary analyzer | Lowell D. Jacobson | 2004-03-30 |
| 6587582 | Semiconductor device image inspection with contrast enhancement | Sanjay Nichani | 2003-07-01 |
| 6298149 | Semiconductor device image inspection with contrast enhancement | Sanjay Nichani | 2001-10-02 |
| 6175644 | Machine vision system for object feature analysis and validation based on multiple object images | Vladimir Ruzhitsky, Lowell D. Jacobson | 2001-01-16 |
| 5949901 | Semiconductor device image inspection utilizing image subtraction and threshold imaging | Sanjay Nichani | 1999-09-07 |
| 5949905 | Model-based adaptive segmentation | Sanjay Nichani | 1999-09-07 |
| 5742037 | Method and apparatus for high speed identification of objects having an identifying feature | David Y. Li | 1998-04-21 |