JV

Jan Verspecht

KT Keysight Technologies: 14 patents #5 of 567Top 1%
AT Agilent Technologies: 5 patents #434 of 3,411Top 15%
Overall (All Time): #181,359 of 4,157,543Top 5%
23
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
12158491 Phase distortion measurement Bogdan Szafraniec 2024-12-03
11268997 Method and apparatus for characterizing homodyne transmitters and receivers Augustine Stav 2022-03-08
11137445 Method and apparatus for reducing non-linear distortion Augustine Stav 2021-10-05
11057256 Measurement of periodically modulated signals under non-coherent operating conditions Troels Studsgaard Nielsen 2021-07-06
10845401 Nonlinear distortion detection Keith F. Anderson, Joel P. Dunsmore 2020-11-24
10735036 Method for measuring frequency offset between an RF transmitter and a test receiver Troels Studsgaard Nielsen 2020-08-04
10387592 Method and system for characterizing, modeling and simulating non-linear components having long term memory effects 2019-08-20
10003419 Method and system of preventing interference caused by images Jean-Pierre Teyssier, Troels Studsgaard Nielsen 2018-06-19
9793857 Method and apparatus for characterizing local oscillator path dispersion Keith F. Anderson, Troels Studsgaard Nielsen 2017-10-17
9698919 Method and apparatus for spectral stitching discontinuous spectra using reference channel, pilot tones and comb signal Troels Studsgaard Nielsen 2017-07-04
9673914 Method and apparatus for spectral stitching using reference channel and a pilot tone Troels Studsgaard Nielsen, Keith F. Anderson 2017-06-06
9520954 Method and system for characterizing phase dispersion in intermediate frequency channel of receiver Keith F. Anderson 2016-12-13
9252895 System and method of measuring full spectrum of modulated output signal from device under test 2016-02-02
8914271 Method for predistorting signals for non-linear components in the presence of long term memory effects 2014-12-16
7295961 Method for generating a circuit model David E. Root, Nicholas B. Tuffilaro, John Wood 2007-11-13
7282926 Method and an apparatus for characterizing a high-frequency device-under-test in a large signal impedance tuning environment Jean-Pierre Teyssier 2007-10-16
7268530 Method to measure the mutual phase relationship of a set of spectral components generated by a signal generator 2007-09-11
7231311 Method for characterizing high-frequency mixers 2007-06-12
7038468 Method and a test setup for measuring large-signal S-parameters that include the coefficients relating to the conjugate of the incident waves 2006-05-02
6943561 Method of and an apparatus for collecting RF input and output and biasing signal data of a device under test 2005-09-13
6930564 Providing controllable impedance at a reference plane in a circuit 2005-08-16
6839657 Method of and an arrangement for characterizing non-linear behavior of RF and microwave devices in a near matched environment Frans Verbeyst 2005-01-04
6812714 Apparatus for collecting signal measurement data at signal ports of an RF and microwave device-under-test, under different impedance load conditions Ewout Vandamme 2004-11-02