Issued Patents All Time
Showing 1–19 of 19 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11774372 | Smart coordinate conversion and calibration system in semiconductor wafer manufacturing | — | 2023-10-03 |
| 11774373 | Smart coordinate conversion and calibration system in semiconductor wafer manufacturing | — | 2023-10-03 |
| 11761904 | Smart defect calibration system in semiconductor wafer manufacturing | — | 2023-09-19 |
| 11719648 | Method for smart conversion and calibration of coordinate | — | 2023-08-08 |
| 11719649 | Method for smart conversion and calibration of coordinate | — | 2023-08-08 |
| 11719650 | Method for performing smart semiconductor wafer defect calibration | — | 2023-08-08 |
| 11016035 | Smart defect calibration system and the method thereof | — | 2021-05-25 |
| 10726192 | Semiconductor Fab's defect operating system and method thereof | RAY JENN TSAY | 2020-07-28 |
| 10719655 | Method and system for quickly diagnosing, classifying, and sampling in-line defects based on CAA pre-diagnosis database | — | 2020-07-21 |
| 10409924 | Intelligent CAA failure pre-diagnosis method and system for design layout | — | 2019-09-10 |
| 10312164 | Method and system for intelligent weak pattern diagnosis, and non-transitory computer-readable storage medium | — | 2019-06-04 |
| 10228421 | Method and system for intelligent defect classification and sampling, and non-transitory computer-readable storage device | — | 2019-03-12 |
| 9129237 | Integrated interfacing system and method for intelligent defect yield solutions | — | 2015-09-08 |
| 8908957 | Method for building rule of thumb of defect classification, and methods for classifying defect and judging killer defect based on rule of thumb and critical area analysis | — | 2014-12-09 |
| 8863056 | Integrated design-for-manufacturing platform | Yun Shen, Greg Chang | 2014-10-14 |
| 8607169 | Intelligent defect diagnosis method | — | 2013-12-10 |
| 8473223 | Method for utilizing fabrication defect of an article | — | 2013-06-25 |
| 8312401 | Method for smart defect screen and sample | Chin-Hsen Lin | 2012-11-13 |
| 8095895 | Method for defect diagnosis and management | — | 2012-01-10 |