Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10962569 | Probe, inspection jig, inspection device, and method of manufacturing probe | Michio Kaida | 2021-03-30 |
| D894025 | Electric characteristic measuring probe | Michio Kaida | 2020-08-25 |
| 9130317 | Connector assembly | Hsin-Chieh Wang, Wei-Chu Chen, Yuan-Hsiang Shen, Hsiao-Wei Liu, Yu-Min Cheng +2 more | 2015-09-08 |