HY

Hongning Yang

FS Freeescale Semiconductor: 46 patents #21 of 3,767Top 1%
NU Nxp Usa: 21 patents #44 of 2,066Top 3%
SA Sharp Laboratories Of America: 4 patents #168 of 419Top 45%
Sharp Kabushiki Kaisha: 2 patents #5,184 of 10,731Top 50%
ST Sharp Microelectronics Technology: 1 patents #25 of 57Top 45%
Overall (All Time): #27,938 of 4,157,543Top 1%
72
Patents All Time

Issued Patents All Time

Showing 1–25 of 72 patents

Patent #TitleCo-InventorsDate
10297676 Partially biased isolation in semiconductor device Xin Lin, Ronghua Zhu 2019-05-21
10217860 Partially biased isolation in semiconductor devices Daniel J. Blomberg, Xu Cheng, Xin Lin, Zhihong Zhang, Jiang-Kai Zuo 2019-02-26
10177252 Semiconductor device isolation with RESURF layer arrangement Xin Lin, Ronghua Zhu, Jiang-Kai Zuo 2019-01-08
9941350 Semiconductor device isolation via depleted coupling layer Xin Lin, Ronghua Zhu, Jiang-Kai Zuo 2018-04-10
9871135 Semiconductor device and method of making Xin Lin, Ronghua Zhu, Jiang-Kai Zuo 2018-01-16
9831338 Alternating source region arrangement Xin Lin, Ronghua Zhu, Jiang-Kai Zuo 2017-11-28
9825169 Partial, self-biased isolation in semiconductor devices Xin Lin, Xu Cheng, Zhihong Zhang, Jiang-Kai Zuo 2017-11-21
9761707 Laterally diffused MOSFET with isolation region Xin Lin, Ronghua Zhu 2017-09-12
9728600 Partially biased isolation in semiconductor devices Daniel J. Blomberg, Xu Cheng, Xin Lin, Zhihong Zhang, Jiang-Kai Zuo 2017-08-08
9691880 Semiconductor device with enhanced 3D resurf Xin Lin, Zhihong Zhang, Jiang-Kai Zuo 2017-06-27
9680011 Self-adjusted isolation bias in semiconductor devices Zhihong Zhang, Daniel J. Blomberg, Xu Cheng, Xin Lin, Jiang-Kai Zuo 2017-06-13
9666671 Semiconductor device with composite drift region and related fabrication method Zhihong Zhang, Jiang-Kai Zuo 2017-05-30
9647082 Diodes with multiple junctions Xin Lin, Daniel J. Blomberg, Jiang-Kai Zuo 2017-05-09
9640635 Reliability in mergeable semiconductor devices Zhihong Zhang, Daniel J. Blomberg, Jiang-Kai Zuo 2017-05-02
9614074 Partial, self-biased isolation in semiconductor devices Xin Lin, Jiang-Kai Zuo 2017-04-04
9614041 Multi-gate semiconductor devices with improved hot-carrier injection immunity Zhihong Zhang, Jiang-Kai Zuo 2017-04-04
9601614 Composite semiconductor device with different channel widths Won Gi Min, Pete Rodriquez, Jiang-Kai Zuo 2017-03-21
9601595 High breakdown voltage LDMOS device Daniel J. Blomberg, Jiang-Kai Zuo 2017-03-21
9590097 Semiconductor devices and related fabrication methods Daniel J. Blomberg, Xin Lin, Zhihong Zhang, Jiang-Kai Zuo 2017-03-07
9543454 Diodes with multiple junctions Xin Lin, Daniel J. Blomberg, Jiang-Kai Zuo 2017-01-10
9543379 Semiconductor device with peripheral breakdown protection Xin Lin, Zhihong Zhang, Jiang-Kai Zuo 2017-01-10
9508845 LDMOS device with high-potential-biased isolation ring Xin Lin, Jiang-Kai Zuo 2016-11-29
9496333 Resurf high voltage diode Xin Lin, Daniel J. Blomberg, Jiang-Kai Zuo 2016-11-15
9490322 Semiconductor device with enhanced 3D resurf Xin Lin, Zhihong Zhang, Jiang-Kai Zuo 2016-11-08
9478456 Semiconductor device with composite drift region Jiang-Kai Zuo 2016-10-25