Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6897955 | Ellipsometer | Uwe Wielsch, Michael Arena, Uwe Richter, Georg Dittmar, Albrecht Kruger | 2005-05-24 |
| 5526117 | Method for the determination of characteristic values of transparent layers with the aid of ellipsometry | Uwe Wielsch, Uwe Richter, Albrecht Kruger | 1996-06-11 |