Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8988521 | Method of measuring critical dimension of pattern and apparatus for performing the same | Hyung Joo Lee, Won Joo Park | 2015-03-24 |
HY
Han-June Yoon
Overall (All Time): #3,044,515 of 4,157,543Top 75%
1
Patents All Time