Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11631927 | Probe calibration system and method for electromagnetic compatibility testing | — | 2023-04-18 |
| 10325057 | Using computer-aided design layout in scanning system | Giorgi Muchaidze, Besarion Chikhradze | 2019-06-18 |
| 9618554 | Emission source microscopy for electromagnetic interference applications | — | 2017-04-11 |