Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5214375 | Multi-point probe assembly for testing electronic device | Miyoshi Okumura, Kaoru Sato, Yutaka Okumura | 1993-05-25 |
| 5084672 | Multi-point probe assembly for testing electronic device | Miyoshi Okumura, Kaoru Sato, Yutaka Okumura | 1992-01-28 |