Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12360159 | Terahertz plasmonics for testing very large-scale integrated circuits under bias | John Suarez, Sergey Rudin, Meredith Reed, Michael Shur | 2025-07-15 |
| 11675002 | Terahertz plasmonics for testing very large-scale integrated circuits under bias | John Suarez, Sergey Rudin, Meredith Reed, Michael Shur | 2023-06-13 |
| 10890618 | Terahertz plasmonics for testing very large-scale integrated circuits under bias | John Suarez, Sergey Rudin, Meredith Reed, Michael Shur | 2021-01-12 |