GC

George W. Conner

TE Teradyne: 21 patents #6 of 581Top 2%
SI Signetics: 3 patents #5 of 93Top 6%
ND North American Philips Corp., Signetics Division: 1 patents #9 of 43Top 25%
PA Philips Electronics North America: 1 patents #328 of 725Top 50%
Overall (All Time): #124,339 of 4,157,543Top 3%
30
Patents All Time

Issued Patents All Time

Showing 25 most recent of 30 patents

Patent #TitleCo-InventorsDate
10973352 Reuseable straw caddy 2021-04-13
D915153 Straw dispenser 2021-04-06
10959509 Reuseable straw wash tool assembly 2021-03-30
10827823 Reusable straw wash tool assembly 2020-11-10
9791511 Method and apparatus for low latency communication in an automatic testing system Thien Duyen Thi Nguyen 2017-10-17
9577818 High speed data transfer using calibrated, single-clock source synchronous serializer-deserializer protocol 2017-02-21
8805636 Protocol aware digital channel apparatus 2014-08-12
8725489 Method for testing in a reconfigurable tester 2014-05-13
8521465 General purpose protocol engine 2013-08-27
8269520 Using pattern generators to control flow of data to and from a semiconductor device under test 2012-09-18
8195419 General purpose protocol engine 2012-06-05
8094766 Tracker circuit and method for automated test equipment systems 2012-01-10
7673199 Multi-stream interface for parallel test processing Peter Reichert, Craig E. Robertson 2010-03-02
7593497 Method and apparatus for adjustment of synchronous clock signals 2009-09-22
7523007 Calibration device Li-Ju Huang 2009-04-21
7208937 Hybrid AC/DC-coupled channel for testing 2007-04-24
7174279 Test system with differential signal measurement 2007-02-06
7046027 Interface apparatus for semiconductor device tester 2006-05-16
6879175 Hybrid AC/DC-coupled channel for automatic test equipment 2005-04-12
6486693 Method and apparatus for testing integrated circuit chips that output clocks for timing Peter Reichert 2002-11-26
6469493 Low cost CMOS tester with edge rate compensation Gerald F. Muething, Jr. 2002-10-22
RE36063 Timing generator with edge generators, utilizing programmable delays, providing synchronized timing signals at non-integer multiples of a clock signal 1999-01-26
5794175 Low cost, highly parallel memory tester 1998-08-11
5274796 Timing generator with edge generators, utilizing programmable delays, providing synchronized timing signals at non-integer multiples of a clock signal 1993-12-28
5268314 Method of forming a self-aligned bipolar transistor 1993-12-07