Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4689574 | Electron impact ion source for trace analysis | Kuo-Chin Lin | 1987-08-25 |
| 4202080 | Mass spectrometer filter | Robert A. Holzl, James L. Lawrence | 1980-05-13 |
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4689574 | Electron impact ion source for trace analysis | Kuo-Chin Lin | 1987-08-25 |
| 4202080 | Mass spectrometer filter | Robert A. Holzl, James L. Lawrence | 1980-05-13 |