Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4520308 | Process and device for the nondestructive measurement of material accumulations or coating thicknesses on dielectric materials, in particular plastic | Thomas Rohde | 1985-05-28 |
| 4492915 | Method and apparatus for the electronic measurement of the thickness of very thin electrically conductive films on a nonconductive substrate | — | 1985-01-08 |