Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7095885 | Method for measuring registration of overlapping material layers of an integrated circuit | Troy Gugel | 2006-08-22 |
| 6818910 | Writing methodology to reduce write time, and system for performing same | William A. Stanton | 2004-11-16 |
| 6713233 | Multiple pass write method and reticle | — | 2004-03-30 |
| 6642530 | Multiple pass write method and reticle | — | 2003-11-04 |
| 6472123 | Multiple pass write method and reticle | — | 2002-10-29 |
| 5049925 | Method and apparatus for focusing a wafer stepper | John Reuben Aiton, Patrick W. Vaughn | 1991-09-17 |