Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8937487 | Correction for stress induced leakage current in dielectric reliability evaluations | Steven W. Mittl | 2015-01-20 |
EY
Ernest Y. Yu
Overall (All Time): #3,035,563 of 4,157,543Top 75%
1
Patents All Time