EL

Eng Kiat LEE

JB Jf Microtechnology Sdn. Bhd.: 17 patents #2 of 10Top 20%
📍 Petaling Jaya, MY: #3 of 109 inventorsTop 3%
Overall (All Time): #270,330 of 4,157,543Top 7%
17
Patents All Time

Issued Patents All Time

Showing 1–17 of 17 patents

Patent #TitleCo-InventorsDate
11821916 Ground connector in an integrated circuit testing apparatus Wei Kuong FOONG, Kok Sing GOH, Shamal MUNDIYATH, Fadzhirul Ridhzwan Azry Bin Sulaiman 2023-11-21
11696396 Short interconnect assembly with strip elastomer Wei Kuong FOONG, Kok Sing GOH, Shamal MUNDIYATH, Grace Ann Nee YEE 2023-07-04
11674977 Short interconnect assembly with strip elastomer Wei Kuong FOONG, Kok Sing GOH, Shamal MUNDIYATH, Grace Ann Nee YEE 2023-06-13
11266015 Short interconnect assembly with strip elastomer Wei Kuong FOONG, Kok Sing GOH, Shamal MUNDIYATH, Grace Ann Nee YEE 2022-03-01
10830812 Low inductance electrical contact assembly manufacturing process Wei Kuong FOONG, Kok Sing GOH, Shamal MUNDIYATH 2020-11-10
10826217 Horizontal clamp electrical contact assembly Wei Kuong FOONG, Kok Sing GOH, Shamal MUNDIYATH, Muhamad Izzat bin Roslee 2020-11-03
10578645 Short contact with multifunctional elastomer Wei Kuong FOONG, Kok Sing GOH, Shamal MUNDIYATH 2020-03-03
10527646 Kelvin contact assembly and method of installation thereof Wei Kuong FOONG, Kok Sing GOH, Shamal MUNDIYATH 2020-01-07
10488439 Compressible layer with integrated bridge in IC testing apparatus Wei Kuong FOONG, Kok Sing GOH, Shamal MUNDIYATH 2019-11-26
10466300 High precision vertical motion kelvin contact assembly Wei Kuong FOONG, Kok Sing GOH, Shamal MUNDIYATH, Mei Chen CHIN 2019-11-05
10446965 Spring contact in a testing apparatus for integrated circuits Wei Kuong FOONG, Kok Sing GOH, Shamal MUNDIYATH 2019-10-15
10031163 Compressible layer with integrated bridge in IC testing apparatus Wei Kuong FOONG, Kok Sing GOH, Shamal MUNDIYATH 2018-07-24
10018653 Kelvin contact assembly in a testing apparatus for integrated circuits Wei Kuong FOONG, Kok Sing GOH, Shamal MUNDIYATH 2018-07-10
10018652 Short contact in a testing apparatus for wireless integrated circuits Wei Kuong FOONG, Kok Sing GOH, Shamal MUNDIYATH 2018-07-10
9658253 Contact assembly in a testing apparatus for integrated circuits Wei Kuong FOONG, Kok Sing GOH, Shamal MUNDIYATH 2017-05-23
9140721 Electrical interconnect assembly Wei Kuong FOONG, Kok Sing GOH, Shamal MUNDIYATH 2015-09-22
8952714 Electrical interconnect assembly Wei Kuong FOONG, Kok Sing GOH, Shamal MUNDIYATH 2015-02-10