Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11486883 | Method for using light scattering in real time to directly monitor and control impurity removal in purification processes | Arthur C. Hewig, III, Yinges Yigzaw, Robert F. Bailey | 2022-11-01 |
| 11293930 | Method for using light scattering in real time to directly monitor and control impurity removal in purification processes | Arthur C. Hewig, III, Yinges Yigzaw, Robert F. Bailey | 2022-04-05 |
| 10481164 | Method for using light scattering in real time to directly monitor and control impurity removal in purification processes | Arthur C. Hewig, III, Yinges Yigzaw, Robert F. Bailey | 2019-11-19 |