Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6097361 | Photolithographic exposure system and method employing a liquid crystal display (LCD) panel as a configurable mask | — | 2000-08-01 |
| 6073501 | Apparatus and method for semiconductor wafer processing which facilitate determination of a source of contaminants or defects | — | 2000-06-13 |
| 5988874 | Black body reference for RTA | — | 1999-11-23 |
| 5980979 | Method for consistently forming low resistance contact structures involving the removal of adhesion layer particles blocking via openings | — | 1999-11-09 |
| 5948219 | Apparatus for selectively exposing a semiconductor topography to an electric field | — | 1999-09-07 |
| 5861632 | Method for monitoring the performance of an ion implanter using reusable wafers | — | 1999-01-19 |
| 5831249 | Secondary measurement of rapid thermal annealer temperature | Hassan Kobeissi | 1998-11-03 |
| 5547902 | Post hot working process for semiconductors | — | 1996-08-20 |
| 5225040 | Process for patterning metal connections in small-geometry semiconductor structures | — | 1993-07-06 |