Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9261464 | Applying edge-on photoluminescence to measure bulk impurities of semiconductor materials | John W. Hadd | 2016-02-16 |
| 7520932 | Method of analyzing carbon concentration in crystalline silicon | — | 2009-04-21 |