Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8619935 | Methods and structure for on-chip clock jitter testing and analysis | Tracy J. Feist | 2013-12-31 |
| 7240264 | Scan test expansion module | Kevin Gearhardt | 2007-07-03 |
| 7202656 | Methods and structure for improved high-speed TDF testing using on-chip PLL | Kevin Gearhardt | 2007-04-10 |
| 7081841 | Analog to digital converter built in self test | Scott Savage, Kevin Gearhardt | 2006-07-25 |