Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7375570 | High-speed TDF testing on low cost testers using on-chip pulse generators and dual ATE references for rapidchip and ASIC devices | Kevin Gearhardt | 2008-05-20 |
| 7106074 | Technique for measurement of programmable termination resistor networks on rapidchip and ASIC devices | Kevin Gearhardt, Anita Greeb | 2006-09-12 |