Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12301990 | Deep learning model for auto-focusing microscope systems | Tonislav Ivanov, Jonathan Lee | 2025-05-13 |
| 12298489 | Fluorescence microscopy inspection systems, apparatus and methods with darkfield channel | Matthew C. Putman, John B. Putman, Vadim Pinskiy | 2025-05-13 |
| 12140744 | Autofocus system and method | Patrick Schmidt, Tonislav Ivanov, Jonathan Lee | 2024-11-12 |
| 12008737 | Deep learning model for noise reduction in low SNR imaging conditions | Tonislav Ivanov, Jonathan Lee | 2024-06-11 |
| 11796785 | Systems, devices and methods for automatic microscope focus | John B. Putman, Matthew C. Putman, Vadim Pinskiy | 2023-10-24 |
| 11662563 | Fluorescence microscopy inspection systems, apparatus and methods with darkfield channel | Matthew C. Putman, John B. Putman, Vadim Pinskiy | 2023-05-30 |
| 11574413 | Deep photometric learning (DPL) systems, apparatus and methods | Matthew C. Putman, Vadim Pinskiy, Tanaporn Na Narong, Tonislav Ivanov | 2023-02-07 |
| 11520133 | Systems, devices and methods for automatic microscope focus | John B. Putman, Matthew C. Putman, Vadim Pinskiy | 2022-12-06 |
| 11294162 | Fluorescence microscopy inspection systems, apparatus and methods with darkfield channel | Matthew C. Putman, John B. Putman, Vadim Pinskiy | 2022-04-05 |
| 10670850 | Systems, devices and methods for automatic microscope focus | John B. Putman, Matthew C. Putman, Vadim Pinskiy | 2020-06-02 |
| 10578850 | Fluorescence microscopy inspection systems, apparatus and methods | Matthew C. Putman, John B. Putman, Vadim Pinskiy | 2020-03-03 |
| 10146041 | Systems, devices and methods for automatic microscope focus | John B. Putman, Matthew C. Putman, Vadim Pinskiy | 2018-12-04 |