CP

Cindy Pan

TI Texas Instruments: 1 patents #7,357 of 12,488Top 60%
Overall (All Time): #3,546,249 of 4,157,543Top 90%
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Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6396569 Image displacement test reticle for measuring aberration characteristics of projection optics Sandra Zheng 2002-05-28