Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12099025 | Device and method for measuring short-wavelength characteristic X-ray diffraction based on array detection | Lin Zheng, Shitao Dou, Xin Chen, Lunwu ZHANG, Jin Zhang +6 more | 2024-09-24 |