Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7756197 | Built in self test (BIST) for high-speed serial transceivers | Kenneth William Ferguson, Paul Laprise | 2010-07-13 |
| 7363563 | Systems and methods for a built in test circuit for asynchronous testing of high-speed transceivers | Jurgen Hissen, Brett Clark, Stephen Hiroshi Dick | 2008-04-22 |