CR

Chan-Ho Ryu

NI Nanometrics Incorporated: 1 patents #69 of 127Top 55%
Overall (All Time): #3,413,343 of 4,157,543Top 85%
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Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
7027640 Method and apparatus for inspecting defects on polishing pads to be used with chemical mechanical polishing apparatus Sung-Jin Park 2006-04-11