CL

Christopher B. Lesher

FS Freeescale Semiconductor: 1 patents #2,021 of 3,767Top 55%
Overall (All Time): #2,997,385 of 4,157,543Top 75%
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Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
9322870 Wafer-level gate stress testing William E. Edwards, Randall C. Gray 2016-04-26