Issued Patents All Time
Showing 1–17 of 17 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12430880 | Method and system performing pattern clustering | In Huh, Younggu Kim, Jaemyung Choe | 2025-09-30 |
| 12400119 | Learning method and system for object tracking based on hybrid neural network | Moon-Hyun Cha, Il Chae Jung, Bo Han, Daeyoung Park | 2025-08-26 |
| 12236178 | Methods of generating circuit models and manufacturing integrated circuits using the same | Yohan Kim, Jisu Ryu | 2025-02-25 |
| 12175177 | Method and apparatus with system verification based on reinforcement learning | Jun Haeng Lee, Youngmin OH, Hyun-Sun Park, YongWoo Lee, Jaecheol Lee +4 more | 2024-12-24 |
| 11982980 | Simulation method for semiconductor fabrication process and method for manufacturing semiconductor device | Jinwoo Kim, Sanghoon Myung, Wonik Jang, Yongwoo Jeon, Kanghyun Baek +1 more | 2024-05-14 |
| 11886783 | Simulation system for semiconductor process and simulation method thereof | Sanghoon Myung, Hyunjae Jang, In Huh, Hyeon Kyun Noh, Min Chul Park | 2024-01-30 |
| 11853660 | System and method for modeling a semiconductor fabrication process | Hyunjoong Kim, Jaepil Shin, Moonhyun Cha | 2023-12-26 |
| 11775840 | Non-transitory computer-readable medium storing program code generating wafer map based on generative adversarial networks and computing device including the same | Wonik Jang, Sanghoon Myung, Sunghee Lee | 2023-10-03 |
| 11741596 | Semiconductor wafer fault analysis system and operation method thereof | Min Chul Park, Ami MA, Jisu Ryu | 2023-08-29 |
| 11733603 | Proximity correction methods for semiconductor manufacturing processes | Taehoon Kim, Jaeho Jeong, Jeonghoon Ko, Jongwon Kim, Yejin Jeong | 2023-08-22 |
| 11669773 | Electronic devices generating verification vector for verifying semiconductor circuit and methods of operating the same | Seungju Kim, Hyojin Choi, In Huh, Jeonghoon Ko, Younsik Park +1 more | 2023-06-06 |
| 11574095 | Simulation system for semiconductor process and simulation method thereof | Sanghoon Myung, Hyunjae Jang, In Huh, Hyeon Kyun Noh, Min Chul Park | 2023-02-07 |
| 11515057 | High optical transparent two-dimensional electronic conducting system and process for generating same | Muhammad Ashraful Alam, Ruiyi Chen, Suprem R. Das, David B. Janes, Mark Lundstrom | 2022-11-29 |
| 10839974 | High optical transparent two-dimensional electronic conducting system and process for generating same | Muhammad Ashraful Alam, Ruiyi Chen, Suprem R. Das, David B. Janes, Mark Lundstrom | 2020-11-17 |
| 10650910 | Semiconductor fault analysis device and fault analysis method thereof | Sanghoon Myung, Min Chul Park, Jeonghoon Ko, Jisu Ryu, Hyunjae Jang +3 more | 2020-05-12 |
| 10468151 | High optical transparent two-dimensional electronic conducting system and process for generating same | Muhammad Ashraful Alam, Ruiyi Chen, Suprem R. Das, David B. Janes, Mark Lundstrom | 2019-11-05 |
| 9524806 | Hybrid transparent conducting materials | Mark Lundstrom, Muhammad Ashraful Alam | 2016-12-20 |