Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5047711 | Wafer-level burn-in testing of integrated circuits | William H. Smith | 1991-09-10 |
| 4876216 | Semiconductor integrated circuit manufacturing process providing oxide-filled trench isolation of circuit devices | Eric Tobias | 1989-10-24 |
| 4389255 | Method of forming buried collector for bipolar transistor in a semiconductor by selective implantation of poly-si followed by oxidation and etch-off | Anant O. Dixit | 1983-06-21 |