Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10914785 | Testing method and testing system | Hsing-Han Tseng, Yi-Te Yeh, Yung-Jen Chen, Te-Ming Kuo | 2021-02-09 |
| 10598730 | Testing method and testing system | Yi-Te Yeh, Chia-Hsien Cheng, I-Chang Wu, Huai-Yu Yen | 2020-03-24 |
| 8773944 | Concurrent multiple-dimension word-addressable memory architecture | Inyup Kang, Viraphol Chaiyakul | 2014-07-08 |
| 8120989 | Concurrent multiple-dimension word-addressable memory architecture | Inyup Kang, Viraphol Chaiyakul | 2012-02-21 |