BS

Bruce D. Sudweeks

ME Megatest: 1 patents #4 of 9Top 45%
TE Teradyne: 1 patents #241 of 581Top 45%
Overall (All Time): #2,133,303 of 4,157,543Top 55%
2
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
7509226 Apparatus and method for testing non-deterministic device data Jonathan Hops, Brian G. Swing, John R. Pane, Brian Phelps, James E. Kinslow, Jr. 2009-03-24
5606568 Method and apparatus for performing serial and parallel scan testing on an integrated circuit 1997-02-25