BH

Benjamin Harke

AG Abberior Instruments Gmbh: 8 patents #2 of 12Top 20%
FT Fondazione Istituto Italiano Di Tecnologia: 1 patents #130 of 395Top 35%
Overall (All Time): #534,092 of 4,157,543Top 15%
9
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
12352943 Method and device for illuminating a sample in a microscope in points Lars Kastrup 2025-07-08
12259329 Method of disturbance correction, and laser scanning microscope having disturbance correction Roman SCHMIDT, Lars Kastrup 2025-03-25
12055728 Method and light microscope for a high-resolution examination of a sample Roman SCHMIDT, Matthias Reuss, Lars Kastrup 2024-08-06
11131630 Method of aligning a laser-scanning fluorescence microscope and laser-scanning fluorescence microscope having an automatic aligning system Joern Heine, Matthias Reuss, Lars Kastrup 2021-09-28
10488342 Methods of high-resolution imaging a structure of a sample, the structure being marked with fluorescence markers Andreas Schoenle, Christian Wurm, Gerald Donnert 2019-11-26
10429305 Methods of high-resolution imaging a structure of a sample, the structure being marked with fluorescence markers Andreas Schoenle, Christian Wurm, Gerald Donnert 2019-10-01
10386621 Method of using a high resolution laser scanning microscope and high resolution laser scanning microscope Matthias Reuss, Lars Kastrup 2019-08-20
9772285 Stimulated emission-depletion (STED) microscopy based on time gating of excitation beam and synchronous detection of fluorescence emission Giuseppe Vicidomini, Alberto Diaspro 2017-09-26
9632297 Device for separately modulating the wave fronts of two components of a light beam and microscope comprising the device Matthias Reuss, Andreas Schoenle, Lars Kastrup, Gerald Donnert 2017-04-25