| 12353012 |
Method for manufacturing an optical switching system |
Yakov Roizin |
2025-07-08 |
| 12353017 |
Optical switching system |
Yakov Roizin |
2025-07-08 |
| 10210526 |
Image sensor module and a method for evaluating an image sensor |
Yakov Roizin, Viktor Goldovsky, Yohanan Davidovich, Amos Fenigstein, Assaf Lahav +1 more |
2019-02-19 |
| 9865632 |
Image sensor pixel with memory node having buried channel and diode portions formed on N-type substrate |
Assaf Lahav, Amos Fenigstein, Yakov Roizin |
2018-01-09 |
| 9729810 |
Image sensor pixel with memory node having buried channel and diode portions |
Assaf Lahav, Amos Fenigstein, Yakov Roizin |
2017-08-08 |
| 9431455 |
Back-end processing using low-moisture content oxide cap layer |
Amos Fenigstein, Yakov Roizin |
2016-08-30 |
| 9331123 |
Logic unit including magnetic tunnel junction elements having two different anti-ferromagnetic layers |
Yakov Roizin |
2016-05-03 |
| 9330748 |
High-speed compare operation using magnetic tunnel junction elements including two different anti-ferromagnetic layers |
Yakov Roizin |
2016-05-03 |
| 8599616 |
Three-dimensional NAND memory with stacked mono-crystalline channels |
Yakov Roizin |
2013-12-03 |
| 8501573 |
High-resolution integrated X-ray CMOS image sensor |
Yakov Roizin, Amos Fenigstein, Alexey Heiman, Doron Pardess |
2013-08-06 |
| 8501609 |
Method for generating a three-dimensional NAND memory with mono-crystalline channels using sacrificial material |
Yakov Roizin |
2013-08-06 |
| 7807960 |
Imager module packaging having top and bottom glass layers |
— |
2010-10-05 |
| 7608837 |
High resolution integrated X-ray CMOS image sensor |
Yakov Roizin, Amos Fenigstein, Alexei Heiman, Doron Pardess |
2009-10-27 |