| 10955465 |
Method and apparatus for bond wire testing in an integrated circuit |
John Joseph Arena, Joseph F. Wrinn |
2021-03-23 |
| 10615230 |
Identifying potentially-defective picture elements in an active-matrix display panel |
Jason A. Messier, Bradley A. Phillips, Kyle L. Klatka, Brian Massey, Peter J. D'Antonio |
2020-04-07 |
| 9977052 |
Test fixture |
Joseph F. Wrinn, John P. Toscano, John Joseph Arena |
2018-05-22 |
| 9778314 |
Capacitive opens testing of low profile components |
— |
2017-10-03 |
| 9638742 |
Method and apparatus for testing electrical connections on a printed circuit board |
— |
2017-05-02 |
| 9459312 |
Electronic assembly test system |
John Joseph Arena |
2016-10-04 |
| 8760185 |
Low capacitance probe for testing circuit assembly |
— |
2014-06-24 |
| 8760183 |
Fast open circuit detection for open power and ground pins |
— |
2014-06-24 |
| 8618810 |
Identifying fuel cell defects |
Alexander H. Slocum, R. Scott Ziegenhagen |
2013-12-31 |
| 8604820 |
Test access component for automatic testing of circuit assemblies |
— |
2013-12-10 |
| 8310256 |
Capacitive opens testing in low signal environments |
— |
2012-11-13 |
| 6175230 |
Circuit-board tester with backdrive-based burst timing |
Michael W. Hamblin, Jak Eskici |
2001-01-16 |
| 6114848 |
Direct-measurement provision of safe backdrive levels |
Robert J. Muller, John D. Moniz |
2000-09-05 |
| 5103109 |
Ground-loop interruption circuit |
Moses Khazam, Karl Karash, Charles Smith, Fadi Daou |
1992-04-07 |
| 4517511 |
Current probe signal processing circuit employing sample and hold technique to locate circuit faults |
— |
1985-05-14 |