Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6700581 | In-circuit test using scan chains | David R. Baldwin, Nicholas J. N. Murphy, Paul Simon Pontin, Steve Cooper | 2004-03-02 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6700581 | In-circuit test using scan chains | David R. Baldwin, Nicholas J. N. Murphy, Paul Simon Pontin, Steve Cooper | 2004-03-02 |