Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6763130 | Real time defect source identification | Sasson Somekh | 2004-07-13 |
| 6408219 | FAB yield enhancement system | Patrick Lamey, Gad Yaron | 2002-06-18 |
| 6199157 | System, method and medium for managing information | Dan Bar Dov, Oded Ben-Haim, Roy Lauer, Michael Palatnik | 2001-03-06 |