Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7920265 | Apparatus and method for noise reduction in modulated optical reflectance metrology system | — | 2011-04-05 |
| 6720393 | Melt flow index determination in polymer process control | Peter W. Harper | 2004-04-13 |
| 5355083 | Non-contact sensor and method using inductance and laser distance measurements for measuring the thickness of a layer of material overlaying a substrate | John A. Dahlquist | 1994-10-11 |
| 5113353 | Rheometrics and viscoelasticity measurement | — | 1992-05-12 |
| 4933886 | Device for measuring melt flow index | — | 1990-06-12 |