Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12203973 | Monitoring semiconductor reliability and predicting device failure during device life | — | 2025-01-21 |
| 11650244 | Monitoring semiconductor reliability and predicting device failure during device life | — | 2023-05-16 |
| 5331571 | Testing and emulation of integrated circuits | Marc Birnkrant, Osamu Matsushima, Kyosuke Sugishita, Hisaharu Oba, Katta N. Reddy +2 more | 1994-07-19 |