Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7127359 | Real-time mathematical model for wafer spin defect detection and for misalignment analyses | Errol P. Akomer, Jason Tervooren | 2006-10-24 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7127359 | Real-time mathematical model for wafer spin defect detection and for misalignment analyses | Errol P. Akomer, Jason Tervooren | 2006-10-24 |