Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7292066 | One-time programmable circuit exploiting BJT hFE degradation | Roberto Alini, Sergio Stefano Rovati, Christopher Paskins | 2007-11-06 |
| 6365946 | Integrated-circuit isolation structure and method for forming the same | G. Eric Morgan, Piyush M. Singhal | 2002-04-02 |